A model for edge spectral line emission and application to ion temperature measurements with charge-exchange recombination spectroscopy

E. J. Synakowski, R. E. Bell, C. E. Bush

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

A model for characterizing the cold edge component of spectra measured in charge-exchange recombination spectroscopy (CHERS) applications is presented. It provides a rapid means of constraining the amplitude and width of the cold component of spectra for which the characteristics of the hot charge-exchange emission are desired. The model utilizes the CHERS measurements themselves and measurements of the electron density near the radius of peak background emissivity. A comparison of model predictions with direct measurements of the background emission during neutral beam injection is presented. Influences of changes in background emission on the inferred ion temperature during a neutral beam pulse are discussed.

Original languageEnglish
Pages (from-to)649-651
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number1
DOIs
StatePublished - 1995

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