TY - GEN
T1 - Characterization of interfaces from ultrasonic reflection data
AU - Qu, Jianmin
PY - 1993
Y1 - 1993
N2 - In this paper, an inverse method for ultrasonic reflection data is proposed to characterize bimaterial interfaces. The method is based on a micromechanics approach for the interaction of elastic waves with interfacial defects. For a given interface, the reflection coefficient is obtained first. Then, the interface characteristics are extracted from the reflection coefficient through an inversion procedure. Characterization of interface roughness and interface cracks between dissimilar materials are two examples discussed in detail.
AB - In this paper, an inverse method for ultrasonic reflection data is proposed to characterize bimaterial interfaces. The method is based on a micromechanics approach for the interaction of elastic waves with interfacial defects. For a given interface, the reflection coefficient is obtained first. Then, the interface characteristics are extracted from the reflection coefficient through an inversion procedure. Characterization of interface roughness and interface cracks between dissimilar materials are two examples discussed in detail.
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M3 - Conference contribution
AN - SCOPUS:0027844747
SN - 0791810283
T3 - American Society of Mechanical Engineers, Noise Control and Acoustics Division (Publication) NCA
SP - 107
EP - 115
BT - Dynamic Characterization of Advanced Materials
A2 - Farabee, Theodore M.
A2 - Keith, William L.
A2 - Lueptow, Richard M.
T2 - Proceedings of the 1993 ASME Winter Annual Meeting
Y2 - 28 November 1993 through 3 December 1993
ER -