TY - GEN
T1 - Constitutive modeling of lead-free solders
AU - Pel, M.
AU - Qu, J.
PY - 2005
Y1 - 2005
N2 - Solders are used extensively as electrical interconnects in microelectronics packaging. Because of environmental concerns, lead-based solders are being replaced by Sn/Ag and Sn/Ag/Cu based solder materials. Since the thermomechanical reliability of modern electronic devices depends on, to a large extent, the fatigue and creep behavior of the solder joints, it is imperative to understand the deformation behavior of these new lead-free solders. This study conducted extensive thermomechanical testing on several commercial lead-free solder alloys. Anand viscoplastic model was used to describe the behavior of these materials with new curve fitting techniques. A modified Anand models was proposed that can yield a more accurate description of lead-free solders.
AB - Solders are used extensively as electrical interconnects in microelectronics packaging. Because of environmental concerns, lead-based solders are being replaced by Sn/Ag and Sn/Ag/Cu based solder materials. Since the thermomechanical reliability of modern electronic devices depends on, to a large extent, the fatigue and creep behavior of the solder joints, it is imperative to understand the deformation behavior of these new lead-free solders. This study conducted extensive thermomechanical testing on several commercial lead-free solder alloys. Anand viscoplastic model was used to describe the behavior of these materials with new curve fitting techniques. A modified Anand models was proposed that can yield a more accurate description of lead-free solders.
UR - https://www.scopus.com/pages/publications/33746555443
UR - https://www.scopus.com/inward/citedby.url?scp=33746555443&partnerID=8YFLogxK
U2 - 10.1109/ISAPM.2005.1432043
DO - 10.1109/ISAPM.2005.1432043
M3 - Conference contribution
AN - SCOPUS:33746555443
SN - 0780390857
SN - 9780780390850
T3 - Proceedings of the International Symposium and Exhibition on Advanced Packaging Materials Processes, Properties and Interfaces
SP - 45
EP - 49
BT - Proceedings - 2005 10th International Symposium on Advanced Packaging Materials
T2 - 2005 10th International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces
Y2 - 16 March 2005 through 18 March 2005
ER -