Creep deformation of Ni/YSZ cermet in SOFCs

Wenning Liu, Jianmin Qu

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

Creep deformation becomes relevant for a material when the operating temperature is near or even lower than half of the melting temperature (in degrees of Kelvin) of that material. For most of the SOFCs under development, creep deformation of the Ni/YSZ anode is significant and must be considered. The Ni/YSZ anode is a mixture of Ni and YSZ, or a cermet Due to the reduction of NiO, the Ni/YSZ anode also contains a large number of voids, making it a porous cermet. In this complicated microstructure, creep deformation occurs predominately in the Ni phase. However, the creep behavior of the anode is different from that of bulk Ni, due to the presence of YSZ particles and voids. It will be crucial to develop constitutive models for the Ni/YSZ anode in order to develop predictive tools for failure analysis. In this paper, a micromechanics based constitutive model is developed for the Ni/YSZ cermet. The model takes into account the microstructure of the porous cermet, and is able to describe the creep behavior very well.

Original languageEnglish
Pages (from-to)299-306
Number of pages8
JournalCeramic Engineering and Science Proceedings
Volume26
Issue number4
StatePublished - 2005
Event29th International Conference on Advanced Ceramics and Composites - Cocoa Beach, FL, United States
Duration: 23 Jan 200528 Jan 2005

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