Dependence of dielectric charging on film thickness and deposition conditions

Richard Daigler; Eleni Papandreou; Negar Tavassolian; Matroni Koutsoureli; George Papaioannou; Ioannis Papapolymerou

doi:10.1109/APMC.2008.4958446

Dependence of dielectric charging on film thickness and deposition conditions

Richard Daigler, Eleni Papandreou, Negar Tavassolian, Matroni Koutsoureli, George Papaioannou, Ioannis Papapolymerou

Department of Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Original language	English
Title of host publication	Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008
DOIs	https://doi.org/10.1109/APMC.2008.4958446
State	Published - 2008
Event	2008 Asia Pacific Microwave Conference, APMC 2008 - Hong Kong, China Duration: 16 Dec 2008 → 20 Dec 2008

Publication series

Name	Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008

Conference

Conference	2008 Asia Pacific Microwave Conference, APMC 2008
Country/Territory	China
City	Hong Kong
Period	16/12/08 → 20/12/08

Access to Document

10.1109/APMC.2008.4958446

Cite this

Daigler, R., Papandreou, E., Tavassolian, N., Koutsoureli, M., Papaioannou, G., & Papapolymerou, I. (2008). Dependence of dielectric charging on film thickness and deposition conditions. In Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008 Article 4958446 (Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008). https://doi.org/10.1109/APMC.2008.4958446

@inproceedings{331cc464c42745978871578def9b4b6f,

title = "Dependence of dielectric charging on film thickness and deposition conditions",

author = "Richard Daigler and Eleni Papandreou and Negar Tavassolian and Matroni Koutsoureli and George Papaioannou and Ioannis Papapolymerou",

year = "2008",

doi = "10.1109/APMC.2008.4958446",

language = "English",

isbn = "9781424426423",

series = "Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008",

booktitle = "Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008",

note = "2008 Asia Pacific Microwave Conference, APMC 2008 ; Conference date: 16-12-2008 Through 20-12-2008",

}

Daigler, R, Papandreou, E, Tavassolian, N, Koutsoureli, M, Papaioannou, G & Papapolymerou, I 2008, Dependence of dielectric charging on film thickness and deposition conditions. in Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008., 4958446, Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008, 2008 Asia Pacific Microwave Conference, APMC 2008, Hong Kong, China, 16/12/08. https://doi.org/10.1109/APMC.2008.4958446

Dependence of dielectric charging on film thickness and deposition conditions. / Daigler, Richard; Papandreou, Eleni; Tavassolian, Negar et al.
Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008. 2008. 4958446 (Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Dependence of dielectric charging on film thickness and deposition conditions

AU - Daigler, Richard

AU - Papandreou, Eleni

AU - Tavassolian, Negar

AU - Koutsoureli, Matroni

AU - Papaioannou, George

AU - Papapolymerou, Ioannis

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=69649086900&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69649086900&partnerID=8YFLogxK

U2 - 10.1109/APMC.2008.4958446

DO - 10.1109/APMC.2008.4958446

M3 - Conference contribution

AN - SCOPUS:69649086900

SN - 9781424426423

T3 - Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008

BT - Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008

T2 - 2008 Asia Pacific Microwave Conference, APMC 2008

Y2 - 16 December 2008 through 20 December 2008

ER -

Dependence of dielectric charging on film thickness and deposition conditions

Publication series

Conference

Access to Document

Other files and links

Cite this