Dielectric charging in capacitive RF MEMS switches: The effect of extended durations of electric stress

Negar Tavassolian, George Papaioannou, John Papapolymerou

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Dielectric charging in capacitive RF MEMS switches: The effect of extended durations of electric stress'. Together they form a unique fingerprint.

Physics

Engineering

Material Science

Computer Science