Dynamic properties and nonequilibrium processes in electron-beam scribed YBa2Cu3O7 Josephson junctions

B. A. Davidson, J. E. Nordman, B. M. Hinaus, M. S. Rzchowski, K. Siangchaew, M. Libera

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Abstract

We present a detailed characterization of the dynamic properties of proximity-coupled Josephson junctions in YBa2Cu3O7 fabricated by electron-beam scribing. A full description of the low-temperature behavior includes nonequilibrium processes in the normal barrier as well as wide-junction effects resulting from the planar geometry. Above ∼40 K these junctions obey the standard (equilibrium) resistively-shunted junction (RSJ) model in applied magnetic field. At lower temperatures, the volt-ampere V(I) curves develop a temperature-dependent "excess critical current," saturating at 0.5-0.75 of the total critical current. Below ∼10 K hysteresis is observed. The observed temperature dependence and magnitude of the excess current and hysteresis are qualitatively consistent with published calculations based on the time-dependent Ginzburg-Landau equations. At low temperatures, the V(I) curves in applied field deviate significantly from the RSJ model, which we attribute to wide-junction behavior with a nonuniform bias-current distribution.

Original languageEnglish
Pages (from-to)1290-1292
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number9
DOIs
StatePublished - 1998

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