Effects of a thin CVD-Si layer on the oxidation behavior of Si3Ni4

Irina V. Tsarenko, Henry Du, Woo Young Lee, John Holowczak

Research output: Contribution to journalConference articlepeer-review

Abstract

Si3N4 (SN282) shows classical features of severe oxidation degradation such as formation of blisters in its thermally grown oxide (TGO), extensive cracking, and spallation of the TGO upon oxidation in oxygen at 1200 °C. This study has revealed that SN282 coated with chemically vapor deposited (CVD) polycrystalline Si layers exhibits much improved oxidation behavior in terms of TGO growth rate as well as morphological characteristics of the TGO. Specifically, TGO growth on SN282 coated with CVD Si is reduced by a factor of four compared with uncoated samples. The TGO on the coated samples is glassy in appearance and uniform in thickness. The improved oxidation resistance of SN282 can be attributed to the role of the CVD-Si layer as a diffusion barrier to mitigate the incorporation of impurity cations from SN282 to the TGO.

Original languageEnglish
Pages (from-to)497-504
Number of pages8
JournalCeramic Engineering and Science Proceedings
Volume23
Issue number4
StatePublished - 2002
Event26th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: B - Cocoa Beach, FL, United States
Duration: 13 Jan 200218 Jan 2002

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