TY - JOUR
T1 - Elemental Sulfur as a Versatile Low-Mass-Range Calibration Standard for Laser Desorption Ionization Mass Spectrometry
AU - Kruegel, Andrew
AU - Attygalle, Athula B.
PY - 2010/1
Y1 - 2010/1
N2 - Facile generation of series of singly charged radical anions (Sn-•; n = 1-15) and cations (Sn+•; n = 2-11) by direct laser ionization renders elemental sulfur an excellent material for the low-mass-region calibration of time of flight (TOF) mass spectrometers. Upon irradiation by a 337-nm UV laser, elemental sulfur undergoes facile ionization without the need of an additional laser-absorbing matrix. An intense and evenly spaced set of peaks is obtained in both modes.
AB - Facile generation of series of singly charged radical anions (Sn-•; n = 1-15) and cations (Sn+•; n = 2-11) by direct laser ionization renders elemental sulfur an excellent material for the low-mass-region calibration of time of flight (TOF) mass spectrometers. Upon irradiation by a 337-nm UV laser, elemental sulfur undergoes facile ionization without the need of an additional laser-absorbing matrix. An intense and evenly spaced set of peaks is obtained in both modes.
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U2 - 10.1016/j.jasms.2009.09.011
DO - 10.1016/j.jasms.2009.09.011
M3 - Article
AN - SCOPUS:73449110905
SN - 1044-0305
VL - 21
SP - 112
EP - 116
JO - Journal of the American Society for Mass Spectrometry
JF - Journal of the American Society for Mass Spectrometry
IS - 1
ER -