TY - GEN
T1 - Exploring Diffusion Models' Corruption Stage in Few-Shot Fine-tuning and Mitigating with Bayesian Neural Networks
AU - Wu, Xiaoyu
AU - Zhang, Jiaru
AU - Hua, Yang
AU - Lyu, Bohan
AU - Wang, Hao
AU - Song, Tao
AU - Guan, Haibing
N1 - Publisher Copyright:
© 2026 Owner/Author.
PY - 2026/4/20
Y1 - 2026/4/20
N2 - Few-shot fine-tuning of Diffusion Models (DMs) is a key advancement, significantly reducing training costs and enabling personalized AI applications. However, we explore the training dynamics of DMs and observe an unanticipated phenomenon: during the training process, image fidelity initially improves, then unexpectedly deteriorates with the emergence of noisy patterns, only to recover later with severe overfitting. We term the stage with generated noisy patterns as corruption stage. To understand this corruption stage, we begin by heuristically modeling the one-shot fine-tuning scenario, and then extend this modeling to more general cases. Through this modeling, we identify the primary cause of this corruption stage: a narrowed learning distribution inherent in the nature of few-shot fine-tuning. To tackle this, we apply Bayesian Neural Networks (BNNs) on DMs with variational inference to implicitly broaden the learned distribution, and present that the learning target of the BNNs can be naturally regarded as an expectation of the diffusion loss and a further regularization with the pretrained DMs. This approach is highly compatible with current few-shot fine-tuning methods in DMs and does not introduce any extra inference costs. Experimental results demonstrate that our method significantly mitigates corruption, and improves the fidelity, quality and diversity of the generated images in both object-driven and subject-driven generation tasks.
AB - Few-shot fine-tuning of Diffusion Models (DMs) is a key advancement, significantly reducing training costs and enabling personalized AI applications. However, we explore the training dynamics of DMs and observe an unanticipated phenomenon: during the training process, image fidelity initially improves, then unexpectedly deteriorates with the emergence of noisy patterns, only to recover later with severe overfitting. We term the stage with generated noisy patterns as corruption stage. To understand this corruption stage, we begin by heuristically modeling the one-shot fine-tuning scenario, and then extend this modeling to more general cases. Through this modeling, we identify the primary cause of this corruption stage: a narrowed learning distribution inherent in the nature of few-shot fine-tuning. To tackle this, we apply Bayesian Neural Networks (BNNs) on DMs with variational inference to implicitly broaden the learned distribution, and present that the learning target of the BNNs can be naturally regarded as an expectation of the diffusion loss and a further regularization with the pretrained DMs. This approach is highly compatible with current few-shot fine-tuning methods in DMs and does not introduce any extra inference costs. Experimental results demonstrate that our method significantly mitigates corruption, and improves the fidelity, quality and diversity of the generated images in both object-driven and subject-driven generation tasks.
KW - bayesian neural networks
KW - diffusion models
KW - few-shot fine-tuning
UR - https://www.scopus.com/pages/publications/105038113415
UR - https://www.scopus.com/pages/publications/105038113415#tab=citedBy
U2 - 10.1145/3770854.3780252
DO - 10.1145/3770854.3780252
M3 - Conference contribution
AN - SCOPUS:105038113415
T3 - Proceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
SP - 1590
EP - 1601
BT - KDD 2026 - Proceedings of the 32nd ACM SIGKDD Conference on Knowledge Discovery and Data Mining V.1
T2 - 32nd ACM SIGKDD Conference on Knowledge Discovery and Data Mining V.1, KDD 2026
Y2 - 9 August 2026 through 13 August 2026
ER -