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Exploring Diffusion Models' Corruption Stage in Few-Shot Fine-tuning and Mitigating with Bayesian Neural Networks

  • Xiaoyu Wu
  • , Jiaru Zhang
  • , Yang Hua
  • , Bohan Lyu
  • , Hao Wang
  • , Tao Song
  • , Haibing Guan
  • Shanghai Jiao Tong University
  • Queen's University Belfast
  • Tsinghua University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Few-shot fine-tuning of Diffusion Models (DMs) is a key advancement, significantly reducing training costs and enabling personalized AI applications. However, we explore the training dynamics of DMs and observe an unanticipated phenomenon: during the training process, image fidelity initially improves, then unexpectedly deteriorates with the emergence of noisy patterns, only to recover later with severe overfitting. We term the stage with generated noisy patterns as corruption stage. To understand this corruption stage, we begin by heuristically modeling the one-shot fine-tuning scenario, and then extend this modeling to more general cases. Through this modeling, we identify the primary cause of this corruption stage: a narrowed learning distribution inherent in the nature of few-shot fine-tuning. To tackle this, we apply Bayesian Neural Networks (BNNs) on DMs with variational inference to implicitly broaden the learned distribution, and present that the learning target of the BNNs can be naturally regarded as an expectation of the diffusion loss and a further regularization with the pretrained DMs. This approach is highly compatible with current few-shot fine-tuning methods in DMs and does not introduce any extra inference costs. Experimental results demonstrate that our method significantly mitigates corruption, and improves the fidelity, quality and diversity of the generated images in both object-driven and subject-driven generation tasks.

Original languageEnglish
Title of host publicationKDD 2026 - Proceedings of the 32nd ACM SIGKDD Conference on Knowledge Discovery and Data Mining V.1
Pages1590-1601
Number of pages12
ISBN (Electronic)9798400722585
DOIs
StatePublished - 20 Apr 2026
Event32nd ACM SIGKDD Conference on Knowledge Discovery and Data Mining V.1, KDD 2026 - Jeju Island, Korea, Republic of
Duration: 9 Aug 202613 Aug 2026

Publication series

NameProceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Volume1-A
ISSN (Print)2154-817X

Conference

Conference32nd ACM SIGKDD Conference on Knowledge Discovery and Data Mining V.1, KDD 2026
Country/TerritoryKorea, Republic of
CityJeju Island
Period9/08/2613/08/26

Keywords

  • bayesian neural networks
  • diffusion models
  • few-shot fine-tuning

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