High-resistivity SNS josephson junctions scribed in YBazCusOy.g by electron irradiation

B. A. Davidson; B. Hinaus; M. Rzchowski; K. Siangchaew; M. Libéra; J. E. Nordman

doi:10.1109/77.621751

High-resistivity SNS josephson junctions scribed in YBazCusOy.g by electron irradiation

B. A. Davidson, B. Hinaus, M. Rzchowski, K. Siangchaew, M. Libéra, J. E. Nordman

Department of Chemical Engineering and Materials Science

University of Wisconsin-Madison

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

We demonstrate that the behavior of Josephson junctions scribed in YBa₂Cu₃O_{7_5} (YBCO) with a high-brightness electron source are described well by conventional superconductornormal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (7dv=0) intermediate length ( L/n(rc)=8-10) and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region a junction length L~5 nm and a normal resistivity near the metallic limit. lcRn products higher than 3 mV at low temperatures are observed.

Original language	English
Pages (from-to)	2518-2521
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	7
Issue number	2 PART 3
DOIs	https://doi.org/10.1109/77.621751
State	Published - 1997

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abstract = "We demonstrate that the behavior of Josephson junctions scribed in YBa2Cu3O7_5 (YBCO) with a high-brightness electron source are described well by conventional superconductornormal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (7dv=0) intermediate length ( L/n(rc)=8-10) and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region a junction length L~5 nm and a normal resistivity near the metallic limit. lcRn products higher than 3 mV at low temperatures are observed.",

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AU - Davidson, B. A.

AU - Hinaus, B.

AU - Rzchowski, M.

AU - Siangchaew, K.

AU - Libéra, M.

AU - Nordman, J. E.

PY - 1997

Y1 - 1997

N2 - We demonstrate that the behavior of Josephson junctions scribed in YBa2Cu3O7_5 (YBCO) with a high-brightness electron source are described well by conventional superconductornormal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (7dv=0) intermediate length ( L/n(rc)=8-10) and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region a junction length L~5 nm and a normal resistivity near the metallic limit. lcRn products higher than 3 mV at low temperatures are observed.

AB - We demonstrate that the behavior of Josephson junctions scribed in YBa2Cu3O7_5 (YBCO) with a high-brightness electron source are described well by conventional superconductornormal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (7dv=0) intermediate length ( L/n(rc)=8-10) and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region a junction length L~5 nm and a normal resistivity near the metallic limit. lcRn products higher than 3 mV at low temperatures are observed.

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High-resistivity SNS josephson junctions scribed in YBazCusOy.g by electron irradiation

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