I See You: Using RF Signals to See Inside Manufacturing Processes

Oscar R. Hernandez; Bethanie Williams; Candan Martin; Clifton Mulke; Gabriela F. Ciocarlie

doi:10.1109/MSEC.2026.3664008

I See You: Using RF Signals to See Inside Manufacturing Processes

Oscar R. Hernandez
, Bethanie Williams
, Candan Martin
, Clifton Mulke
, Gabriela F. Ciocarlie

Department of Computer Science

University of Texas at San Antonio
Sandia National Laboratories

Research output: Contribution to journal › Article › peer-review

Abstract

We present a passive anomaly-detection framework for computer numerical control milling systems that captures naturally radiated radio frequency (RF) emissions from stepper and spindle motors. Results show RF spectral imaging enables scalable, cyber-resilient, trustworthy anomaly detection for Industry 4.0 manufacturing systems.

Original language	English
Pages (from-to)	21-30
Number of pages	10
Journal	IEEE Security and Privacy
Volume	24
Issue number	3
DOIs	https://doi.org/10.1109/MSEC.2026.3664008
State	Published - 1 May 2026

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10.1109/MSEC.2026.3664008

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title = "I See You: Using RF Signals to See Inside Manufacturing Processes",

abstract = "We present a passive anomaly-detection framework for computer numerical control milling systems that captures naturally radiated radio frequency (RF) emissions from stepper and spindle motors. Results show RF spectral imaging enables scalable, cyber-resilient, trustworthy anomaly detection for Industry 4.0 manufacturing systems.",

author = "Hernandez, \{Oscar R.\} and Bethanie Williams and Candan Martin and Clifton Mulke and Ciocarlie, \{Gabriela F.\}",

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AU - Martin, Candan

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AU - Ciocarlie, Gabriela F.

PY - 2026/5/1

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UR - https://www.scopus.com/pages/publications/105031935894#tab=citedBy

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JO - IEEE Security and Privacy

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I See You: Using RF Signals to See Inside Manufacturing Processes

Abstract

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