In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration

H. Grebel; B. Iskandar; P. Pien; K. Sheppard

doi:10.1063/1.103739

In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration

H. Grebel, B. Iskandar, P. Pien, K. Sheppard

New Jersey Institute of Technology

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.

Original language	English
Pages (from-to)	2959-2961
Number of pages	3
Journal	Applied Physics Letters
Volume	57
Issue number	27
DOIs	https://doi.org/10.1063/1.103739
State	Published - 1990

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title = "In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration",

abstract = "On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.",

author = "H. Grebel and B. Iskandar and P. Pien and K. Sheppard",

year = "1990",

doi = "10.1063/1.103739",

language = "English",

volume = "57",

pages = "2959--2961",

number = "27",

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TY - JOUR

T1 - In situ monitoring of a laser-induced etched grating on InP

T2 - Thin-film cell configuration

AU - Grebel, H.

AU - Iskandar, B.

AU - Pien, P.

AU - Sheppard, K.

PY - 1990

Y1 - 1990

N2 - On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.

AB - On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.

UR - https://www.scopus.com/pages/publications/0001060623

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U2 - 10.1063/1.103739

DO - 10.1063/1.103739

M3 - Article

AN - SCOPUS:0001060623

SN - 0003-6951

VL - 57

SP - 2959

EP - 2961

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 27

ER -

In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration

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