TY - JOUR
T1 - Material recognition using single photon vibrometer
AU - Ramanathan, Jeevanandha
AU - Garikapati, Malvika
AU - Jalata, Ibsa
AU - Kadrollimath, Chinmay
AU - Mahamuni, Pranav
AU - Hoffman, Dylan
AU - Satyanand, Priyanka
AU - Vrahoretis, Nick
AU - Sua, Yong Meng
AU - Huang, Yuping
N1 - Publisher Copyright:
© 2025 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.
PY - 2025/6/30
Y1 - 2025/6/30
N2 - We demonstrate a single-photon vibrometer for material recognition, combining time-gated photon counting with machine learning. It captures unique vibrational characteristics of materials under acoustic excitation by measuring oscillating flux of the reflected photons projected onto a single spatial mode. The gating window is electronically swept to temporally locate the target while minimizing the background photon counts, thereby enabling faithful measurements under photon-starved operations. The system achieves high classification accuracy by analyzing various machine learning models, including deep learning architectures like fully connected networks and convolutional neural networks. Our results suggest new tools for non-destructive testing, remote sensing, and structural health monitoring, providing robust material recognition in challenging environments.
AB - We demonstrate a single-photon vibrometer for material recognition, combining time-gated photon counting with machine learning. It captures unique vibrational characteristics of materials under acoustic excitation by measuring oscillating flux of the reflected photons projected onto a single spatial mode. The gating window is electronically swept to temporally locate the target while minimizing the background photon counts, thereby enabling faithful measurements under photon-starved operations. The system achieves high classification accuracy by analyzing various machine learning models, including deep learning architectures like fully connected networks and convolutional neural networks. Our results suggest new tools for non-destructive testing, remote sensing, and structural health monitoring, providing robust material recognition in challenging environments.
UR - https://www.scopus.com/pages/publications/105008516568
UR - https://www.scopus.com/pages/publications/105008516568#tab=citedBy
U2 - 10.1364/OE.566439
DO - 10.1364/OE.566439
M3 - Article
C2 - 40798254
AN - SCOPUS:105008516568
SN - 1094-4087
VL - 33
SP - 27003
EP - 27013
JO - Optics Express
JF - Optics Express
IS - 13
ER -