TY - JOUR
T1 - Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheres
AU - Chou, T. M.
AU - Libera, M.
PY - 2003/1
Y1 - 2003/1
N2 - The mean free paths for inelastic electron scattering, λin, in silicon [Si] and poly(styrene) [PS] have been measured using off-axis electron holography in a field-emission transmission electron microscope (FEG TEM). The holographic imaging method determines both quantitative wave phase information as well as elastic energy-filtered wave amplitude information. Using the energy-filtered amplitude data, two-dimensional t/λin images are reconstructed. The present work uses spherical nanoparticles as samples, so the sample thickness at any point in a two-dimensional image can be calculated knowing the center and radius of the projected nanosphere. The thickness contribution to t/λin is removed to obtain quantitative λin values. This work finds values of λiSi=53.8±5.5 and 88.6±6.9nm, and λiPS=78.1±3.4 and 113.0±5.9nm for 120 and 200keV incident electron energies, respectively.
AB - The mean free paths for inelastic electron scattering, λin, in silicon [Si] and poly(styrene) [PS] have been measured using off-axis electron holography in a field-emission transmission electron microscope (FEG TEM). The holographic imaging method determines both quantitative wave phase information as well as elastic energy-filtered wave amplitude information. Using the energy-filtered amplitude data, two-dimensional t/λin images are reconstructed. The present work uses spherical nanoparticles as samples, so the sample thickness at any point in a two-dimensional image can be calculated knowing the center and radius of the projected nanosphere. The thickness contribution to t/λin is removed to obtain quantitative λin values. This work finds values of λiSi=53.8±5.5 and 88.6±6.9nm, and λiPS=78.1±3.4 and 113.0±5.9nm for 120 and 200keV incident electron energies, respectively.
KW - EELS
KW - Electron energy-loss spectroscopy
KW - Electron holography
KW - Inelastic scattering
KW - Mean free path
KW - Transmission electron microscope
UR - http://www.scopus.com/inward/record.url?scp=0037212159&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0037212159&partnerID=8YFLogxK
U2 - 10.1016/S0304-3991(02)00192-4
DO - 10.1016/S0304-3991(02)00192-4
M3 - Article
C2 - 12489593
AN - SCOPUS:0037212159
SN - 0304-3991
VL - 94
SP - 31
EP - 35
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 1
ER -