TY - JOUR
T1 - Measurement of polystyrene mean inner potential by transmission electron holography of latex spheres
AU - Wang, Y. C.
AU - Chou, T. M.
AU - Libera, M.
AU - Voelkl, E.
AU - Frost, B. G.
PY - 1998
Y1 - 1998
N2 - This study describes the use of transmission electron holography to determine the mean inner potential of polystyrene. Spherical nanoparticles of amorphous polystyrene are studied so that the effect of specimen thickness on the phase shift of an incident electron wave can be separated from the intrinsic refractive properties of the specimen. A recursive four-parameter χ-squared minimization routine is developed to determine the sphere center, radius, and mean inner potential (φ0) at each pixel in the phase image. Because of the large number of pixels involved, the statistics associated with determining a single φ0 value characteristic of a given sphere are quite good. Simulated holograms show that the holographic reconstruction procedure and the χ-squared analysis method are robust. Averaging the φ0 data derived from ten phase images from ten different polystyrene spheres gives a value of φ0PS = 8.5 V (σ) = 0.7 V). Specimen charging and electron-beam damage, if present, affect the measurement at a level below the current precision of the experiment.
AB - This study describes the use of transmission electron holography to determine the mean inner potential of polystyrene. Spherical nanoparticles of amorphous polystyrene are studied so that the effect of specimen thickness on the phase shift of an incident electron wave can be separated from the intrinsic refractive properties of the specimen. A recursive four-parameter χ-squared minimization routine is developed to determine the sphere center, radius, and mean inner potential (φ0) at each pixel in the phase image. Because of the large number of pixels involved, the statistics associated with determining a single φ0 value characteristic of a given sphere are quite good. Simulated holograms show that the holographic reconstruction procedure and the χ-squared analysis method are robust. Averaging the φ0 data derived from ten phase images from ten different polystyrene spheres gives a value of φ0PS = 8.5 V (σ) = 0.7 V). Specimen charging and electron-beam damage, if present, affect the measurement at a level below the current precision of the experiment.
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U2 - 10.1017/S143192769898014X
DO - 10.1017/S143192769898014X
M3 - Article
AN - SCOPUS:0032386186
SN - 1431-9276
VL - 4
SP - 146
EP - 157
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
IS - 2
ER -