TY - GEN
T1 - Nonlinear dimensionality reduction for structural discovery in image processing
AU - Floyd, David
AU - Cloutier, Robert
AU - Zigh, Teresa
PY - 2013
Y1 - 2013
N2 - Nonlinear dimensionality reduction techniques are a thriving area of research in many fields, including pattern recognition, statistical learning, medical imaging, and statistics. This is largely driven by our need to collect, represent, manipulate, and understand high-dimensional data in practically all areas of science. Here we define 'high-dimensional' to be where dimension d > 10, and in many applications d 10. In this paper we discuss several nonlinear dimensionality reduction techniques and compare their characteristics, with a focus on applications to improve tractability and provide low-dimensional structural discovery for image processing.
AB - Nonlinear dimensionality reduction techniques are a thriving area of research in many fields, including pattern recognition, statistical learning, medical imaging, and statistics. This is largely driven by our need to collect, represent, manipulate, and understand high-dimensional data in practically all areas of science. Here we define 'high-dimensional' to be where dimension d > 10, and in many applications d 10. In this paper we discuss several nonlinear dimensionality reduction techniques and compare their characteristics, with a focus on applications to improve tractability and provide low-dimensional structural discovery for image processing.
KW - Changed data
KW - Diffusion maps
KW - Generalization
KW - Kernel eigenmaps
KW - Temporal graph evolution
KW - Vector
UR - http://www.scopus.com/inward/record.url?scp=84898482365&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84898482365&partnerID=8YFLogxK
U2 - 10.1109/AIPR.2013.6749319
DO - 10.1109/AIPR.2013.6749319
M3 - Conference contribution
AN - SCOPUS:84898482365
SN - 9781479925407
T3 - Proceedings - Applied Imagery Pattern Recognition Workshop
BT - 2013 IEEE Applied Imagery Pattern Recognition Workshop
T2 - 2013 IEEE Applied Imagery Pattern Recognition Workshop: Sensing for Control and Augmentation, AIPR 2013
Y2 - 23 October 2013 through 25 October 2013
ER -