PatchMatch based joint view selection and depthmap estimation

Enliang Zheng, Enrique Dunn, Vladimir Jojic, Jan Michael Frahm

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

176 Scopus citations

Abstract

We propose a multi-view depthmap estimation approach aimed at adaptively ascertaining the pixel level data associations between a reference image and all the elements of a source image set. Namely, we address the question, what aggregation subset of the source image set should we use to estimate the depth of a particular pixel in the reference image? We pose the problem within a probabilistic framework that jointly models pixel-level view selection and depthmap estimation given the local pairwise image photoconsistency. The corresponding graphical model is solved by EM-based view selection probability inference and PatchMatch-like depth sampling and propagation. Experimental results on standard multi-view benchmarks convey the state-of-the art estimation accuracy afforded by mitigating spurious pixel level data associations. Additionally, experiments on large Internet crowd sourced data demonstrate the robustness of our approach against unstructured and heterogeneous image capture characteristics. Moreover, the linear computational and storage requirements of our formulation, as well as its inherent parallelism, enables an efficient and scalable GPU-based implementation.

Original languageEnglish
Title of host publicationProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Pages1510-1517
Number of pages8
ISBN (Electronic)9781479951178, 9781479951178
DOIs
StatePublished - 24 Sep 2014
Event27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014 - Columbus, United States
Duration: 23 Jun 201428 Jun 2014

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014
Country/TerritoryUnited States
CityColumbus
Period23/06/1428/06/14

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