Abstract
We have developed an imaging method for locating isolated nonlinear scattering source(s) in solids. It relies on extracting the nonlinear response of a solid by modulation of a high by a low-frequency wave, and employing moving-window, synchronous detection. The resulting image consists of nonlinear wave reflection profiles with remarkable sensitivity to an isolated elastic nonlinear source(s). In creating the image, we can distinguish between a nonlinear scattering source and other wave scatterers in the material. The method should work equally well for imaging the relative nonlinearity of different regions within a volume.
Original language | English |
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Pages (from-to) | 646-648 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 4 |
DOIs | |
State | Published - 22 Jul 2002 |