TY - GEN
T1 - Signature Analysis
T2 - 22nd International Symposium for Testing and Failure Analysis, ISTFA 1996
AU - Lakshminarayan, C. K.
AU - Pabbisetty, S.
AU - Adams, O.
AU - Pires, F.
AU - Thomas, M.
AU - Han, C. P.
N1 - Publisher Copyright:
Copyright © 1996 ASM International® All rights reserved.
PY - 1996
Y1 - 1996
N2 - This paper deals with the basic concepts of Signature Analysis and the application of statistical models for its implementation. It develops a scheme for computing sample sizes when the failures are random. It also introduces statistical models that comprehend correlations among failures that fail due to the same failure mechanism. The idea of correlation is important because semiconductor chips are processed in batches. Also any risk assessment model should comprehend correlations over time. The statistical models developed will provide the required sample sizes for the Failure Analysis lab to state "We are A% confident that B% of future parts will fail due to the same signature." The paper provides tables and graphs for the evaluation of such a risk assessment. The implementation of Signature Analysis will achieve the dual objective of improved customer satisfaction and reduced cycle time. This paper will also highlight it's applicability as well as the essential elements that need to be in place for it to be effective. Different examples have been illustrated of how the concept is being used by Failure Analysis Operations (FA) and Customer Quality and Reliability Engineering groups.
AB - This paper deals with the basic concepts of Signature Analysis and the application of statistical models for its implementation. It develops a scheme for computing sample sizes when the failures are random. It also introduces statistical models that comprehend correlations among failures that fail due to the same failure mechanism. The idea of correlation is important because semiconductor chips are processed in batches. Also any risk assessment model should comprehend correlations over time. The statistical models developed will provide the required sample sizes for the Failure Analysis lab to state "We are A% confident that B% of future parts will fail due to the same signature." The paper provides tables and graphs for the evaluation of such a risk assessment. The implementation of Signature Analysis will achieve the dual objective of improved customer satisfaction and reduced cycle time. This paper will also highlight it's applicability as well as the essential elements that need to be in place for it to be effective. Different examples have been illustrated of how the concept is being used by Failure Analysis Operations (FA) and Customer Quality and Reliability Engineering groups.
UR - http://www.scopus.com/inward/record.url?scp=85056942820&partnerID=8YFLogxK
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U2 - 10.31399/asm.cp.istfa1996p0183
DO - 10.31399/asm.cp.istfa1996p0183
M3 - Conference contribution
AN - SCOPUS:85056942820
T3 - Conference Proceedings from the International Symposium for Testing and Failure Analysis
SP - 183
EP - 188
BT - ISTFA 1996
Y2 - 18 November 1996 through 22 November 1996
ER -