Signature Analysis: Statistical Models and Their Application to FA

C. K. Lakshminarayan, S. Pabbisetty, O. Adams, F. Pires, M. Thomas, C. P. Han

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper deals with the basic concepts of Signature Analysis and the application of statistical models for its implementation. It develops a scheme for computing sample sizes when the failures are random. It also introduces statistical models that comprehend correlations among failures that fail due to the same failure mechanism. The idea of correlation is important because semiconductor chips are processed in batches. Also any risk assessment model should comprehend correlations over time. The statistical models developed will provide the required sample sizes for the Failure Analysis lab to state "We are A% confident that B% of future parts will fail due to the same signature." The paper provides tables and graphs for the evaluation of such a risk assessment. The implementation of Signature Analysis will achieve the dual objective of improved customer satisfaction and reduced cycle time. This paper will also highlight it's applicability as well as the essential elements that need to be in place for it to be effective. Different examples have been illustrated of how the concept is being used by Failure Analysis Operations (FA) and Customer Quality and Reliability Engineering groups.

Original languageEnglish
Title of host publicationISTFA 1996
Subtitle of host publicationConference Proceedings from the 22nd International Symposium for Testing and Failure Analysis
Pages183-188
Number of pages6
ISBN (Electronic)9781615030811
DOIs
StatePublished - 1996
Event22nd International Symposium for Testing and Failure Analysis, ISTFA 1996 - Los Angeles, United States
Duration: 18 Nov 199622 Nov 1996

Publication series

NameConference Proceedings from the International Symposium for Testing and Failure Analysis
Volume1996-November

Conference

Conference22nd International Symposium for Testing and Failure Analysis, ISTFA 1996
Country/TerritoryUnited States
CityLos Angeles
Period18/11/9622/11/96

Fingerprint

Dive into the research topics of 'Signature Analysis: Statistical Models and Their Application to FA'. Together they form a unique fingerprint.

Cite this