Abstract
We explore an active illumination approach to remote material recognition, based on quantum parametric mode sorting and single-photon detection. By measuring a photon's time of flight at picosecond resolution, 97.8% recognition is demonstrated by illuminating only a single point on the materials. Thanks to the exceptional detection sensitivity and noise rejection, a high recognition accuracy of 96.1% is achieved even when the materials are occluded by a lossy and multiscattering obscurant.
| Original language | English |
|---|---|
| Pages (from-to) | 4109-4112 |
| Number of pages | 4 |
| Journal | Applied Optics |
| Volume | 60 |
| Issue number | 14 |
| DOIs | |
| State | Published - 10 May 2021 |