Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski; Robert A. Pastore; Xiaomeng Yang; Jiashi Yang; Joseph A. Turner

doi:10.1109/TUFFC.2009.1012

Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski
, Robert A. Pastore
, Xiaomeng Yang
, Jiashi Yang
, Joseph A. Turner

Department of Physics

University of Nebraska-Lincoln

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

Original language	English
Article number	4775271
Pages (from-to)	129-135
Number of pages	7
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	56
Issue number	1
DOIs	https://doi.org/10.1109/TUFFC.2009.1012
State	Published - Jan 2009

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10.1109/TUFFC.2009.1012

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abstract = "In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.",

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AB - In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

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JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

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ER -

Stress-induced frequency shifts in langasite thickness-mode resonators

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