Abstract
We explore an active illumination approach for remote and obscured material recognition, based on quantum parametric mode sorting and single-photon detection. By raster scanning a segment of material, we capture the relationships between each mirror position’s peak count and location. These features allow for a robust measurement of a material’s relative reflectance and surface texture. Through inputting these identifiers into machine learning algorithms, a high accuracy of 99% material recognition can be achieved, even maintaining up to 89.17% accuracy when materials are occluded by a lossy and multi-scattering obscurant of up to 15.2 round-trip optical depth.
| Original language | English |
|---|---|
| Pages (from-to) | 1813-1824 |
| Number of pages | 12 |
| Journal | Optics Continuum |
| Volume | 2 |
| Issue number | 8 |
| DOIs | |
| State | Published - 15 Aug 2023 |