TY - JOUR
T1 - The Direction Vector I Test
AU - Psarris, Kleanthis
AU - Psarris, Kleanthis
AU - Kong, Xiangyun
AU - Psarris, Kleanthis
AU - Klappholz, David
PY - 1993/11
Y1 - 1993/11
N2 - The GCD and Banerjee tests are the standard data dependence tests used to determine whether a loop may be parallelized/vectorized. In an earlier work, we presented a new data dependence test, the I test, which extends the accuracy of the GCD and the Banerjee tests. In the original presentation, only the case of general dependence was considered, i.e., the case of dependence with a direction vector of the form (*, *, …, *). In the present work, we generalize the I test to check for data dependence subject to an arbitrary direction vector.
AB - The GCD and Banerjee tests are the standard data dependence tests used to determine whether a loop may be parallelized/vectorized. In an earlier work, we presented a new data dependence test, the I test, which extends the accuracy of the GCD and the Banerjee tests. In the original presentation, only the case of general dependence was considered, i.e., the case of dependence with a direction vector of the form (*, *, …, *). In the present work, we generalize the I test to check for data dependence subject to an arbitrary direction vector.
KW - Automatic parallelization
KW - Banerjee test
KW - Banerjee-Wolfe test
KW - compilers
KW - data dependence
KW - dependence tests
KW - GCD test
KW - parallelism detection
UR - http://www.scopus.com/inward/record.url?scp=0027698554&partnerID=8YFLogxK
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U2 - 10.1109/71.250105
DO - 10.1109/71.250105
M3 - Article
AN - SCOPUS:0027698554
SN - 1045-9219
VL - 4
SP - 1280
EP - 1290
JO - IEEE Transactions on Parallel and Distributed Systems
JF - IEEE Transactions on Parallel and Distributed Systems
IS - 11
ER -