@inproceedings{f7529cefc76d422ea571ea560947fe74,
title = "Time-resolved optical studies of amorphous CoSi thin film crystallization",
abstract = "Time-resolved reflection and transmission measurements during heating are coupled with transmission electron microscopy (TEM) to study the crystallization of amorphous 75nm Co49Si51 films. The reflection decreases and the transmission increases upon crystallization. Optical data are converted to a measure of the fraction crystallized, X=X(T,t). A Kissinger analysis gives an activation energy for crystallization of 1.1 eV. TEM analysis of films crystallized in-situ show they are principally CoSi with a small amount of CoSi. These results are being used for kinetic modelling of crystallization of amorphous Co-silicide films for potential use in Si mosfet and bipolar technologies.",
author = "M. Libera and T. Kim and K. Siangchaew and L. Clevenger and Q. Hong",
year = "1993",
language = "English",
isbn = "1558991751",
series = "Materials Research Society Symposium Proceedings",
pages = "715--718",
editor = "Atwater, {Harry A.} and Eric Chason and Grabow, {Marcia H.} and Lagally, {Max G.}",
booktitle = "Evolution of Surface and Thin Film Microstructure",
note = "Proceedings of the 1992 Fall Meeting of the Materials Research Society ; Conference date: 30-11-1992 Through 04-12-1992",
}