TY - GEN
T1 - Towards MEMS tester for measuring metal nanofilm's Lorenz number
AU - Xu, Weihe
AU - Chen, Qi
AU - Shi, Yong
PY - 2011
Y1 - 2011
N2 - The Lorenz number of metals has been considered constant according to the Wiedemann-Franz law. But this has been questioned by the most recent research in nano-scale thermal transfer. To study the size effect of Lorenz number for thin film metals, a MEMS tester was designed and fabricated. The tester is capable of measuring the Lorenz number of thin films or nanowires with various dimensions. The ANSYS simulation showed the measurement error generated by the non-uniformity in the heating area is below 2%.
AB - The Lorenz number of metals has been considered constant according to the Wiedemann-Franz law. But this has been questioned by the most recent research in nano-scale thermal transfer. To study the size effect of Lorenz number for thin film metals, a MEMS tester was designed and fabricated. The tester is capable of measuring the Lorenz number of thin films or nanowires with various dimensions. The ANSYS simulation showed the measurement error generated by the non-uniformity in the heating area is below 2%.
UR - http://www.scopus.com/inward/record.url?scp=84863603458&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84863603458&partnerID=8YFLogxK
U2 - 10.1115/DETC2011-47681
DO - 10.1115/DETC2011-47681
M3 - Conference contribution
AN - SCOPUS:84863603458
SN - 9780791854846
T3 - Proceedings of the ASME Design Engineering Technical Conference
SP - 397
EP - 399
BT - ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2011
T2 - ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2011
Y2 - 28 August 2011 through 31 August 2011
ER -